Crystallography Open Database

Information card for entry 4300802

Preview

Coordinates	4300802.cif
Original paper (by DOI)	HTML

Structure parameters

Common name	[Ar*SnNH~2~]~2~.hexane
Formula	C78 H116 N2 Sn2
Calculated formula	C78 H116 N2 Sn2
SMILES	c1(c(cccc1c1c(cc(cc1C(C)C)C(C)C)C(C)C)c1c(C(C)C)cc(cc1C(C)C)C(C)C)[Sn]1[NH2][Sn](c2c(cccc2c2c(cc(cc2C(C)C)C(C)C)C(C)C)c2c(cc(cc2C(C)C)C(C)C)C(C)C)[NH2]1.C(CCC)CC
Title of publication	Synthesis and Characterization of Ge(II), Sn(II), and Pb(II) Monoamides with -NH2 Ligands
Authors of publication	Stanciu, Corneliu; Hino, Shirley S.; Stender, Matthias; Richards, Anne F.; Olmstead, Marilyn M.; Power, Philip P.
Journal of publication	Inorganic Chemistry
Year of publication	2005
Journal volume	44
Journal issue	8
Pages of publication	2774 - 2780
a	9.7531 ± 0.0004 Å
b	13.2513 ± 0.0005 Å
c	13.7548 ± 0.0005 Å
α	92.978 ± 0.001°
β	93.222 ± 0.001°
γ	94.684 ± 0.001°
Cell volume	1766.09 ± 0.12 Å³
Cell temperature	90 ± 2 K
Ambient diffraction temperature	90 ± 2 K
Number of distinct elements	4
Space group number	2
Hermann-Mauguin space group symbol	P -1
Hall space group symbol	-P 1
Residual factor for all reflections	0.0249
Residual factor for significantly intense reflections	0.0226
Weighted residual factors for significantly intense reflections	0.0575
Weighted residual factors for all reflections included in the refinement	0.0587
Goodness-of-fit parameter for all reflections included in the refinement	1.056
Diffraction radiation wavelength	0.71073 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	No

Version history

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