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Information card for entry 4001494
Preview
| Coordinates | 4001494.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Bi Br Cd S2 |
|---|---|
| Calculated formula | Bi Br Cd S2 |
| Title of publication | Synthesis, Structure, and Properties of a New Family of Mixed-Framework Chalcohalide Semiconductors: CdSbS2X (X = Cl, Br), CdBiS2X (X = Cl, Br), and CdBiSe2X (X = Br, I) |
| Authors of publication | Wang, Lei; Hung, Yi-Chung; Hwu, Shiou-Jyh; Koo, Hyun-Joo; Whangbo, M.-H. |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2006 |
| Journal volume | 18 |
| Journal issue | 5 |
| Pages of publication | 1219 |
| a | 12.977 ± 0.003 Å |
| b | 4.012 ± 0.0008 Å |
| c | 9.584 ± 0.0019 Å |
| α | 90° |
| β | 91.07 ± 0.03° |
| γ | 90° |
| Cell volume | 498.89 ± 0.18 Å3 |
| Cell temperature | 293.15 K |
| Ambient diffraction temperature | 293.15 K |
| Number of distinct elements | 4 |
| Space group number | 12 |
| Hermann-Mauguin space group symbol | C 1 2/m 1 |
| Hall space group symbol | -C 2y |
| Residual factor for all reflections | 0.048 |
| Residual factor for significantly intense reflections | 0.0416 |
| Weighted residual factors for significantly intense reflections | 0.0967 |
| Weighted residual factors for all reflections included in the refinement | 0.0989 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.196 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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