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Information card for entry 4000397
Preview
| Coordinates | 4000397.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Ba sialon |
|---|---|
| Formula | Al Ba N7 O2 Si5 |
| Calculated formula | Al Ba N7 O2 Si5 |
| Title of publication | Study of Sialon S-phases M~2~Al~x~Si~12-x~N~16-x~O~2+x~, M = Ba and Ba~0.9~Eu~0.1~, by X-ray Single Crystal Diffraction, X-ray Powder Diffraction, and Solid-State Nuclear Magnetic Resonance |
| Authors of publication | Esmaeilzadeh, Saeid; Grins, Jekabs; Shen, Zhijian; Edén, Mattias; Thiaux, Marie |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2004 |
| Journal volume | 16 |
| Journal issue | 11 |
| Pages of publication | 2113 - 2120 |
| a | 8.23 ± 0.001 Å |
| b | 9.655 ± 0.001 Å |
| c | 4.9093 ± 0.0008 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 390.1 ± 0.09 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 44 |
| Hermann-Mauguin space group symbol | I m m 2 |
| Hall space group symbol | I 2 -2 |
| Residual factor for all reflections | 0.0351 |
| Residual factor for significantly intense reflections | 0.0349 |
| Weighted residual factors for significantly intense reflections | 0.0952 |
| Weighted residual factors for all reflections included in the refinement | 0.0954 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.138 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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