Crystallography Open Database

Information card for entry 4000174

Preview

Coordinates	4000174.cif
Original paper (by DOI)	HTML

Structure parameters

Formula	Ga4.4 Ge0.6 Ni2 Y0.59
Calculated formula	Ga4.39 Ge0.6 Ni2 Y0.59
Journal of publication	Chemistry of Materials
Year of publication	2002
a	4.1344 ± 0.0011 Å
b	4.1344 ± 0.0011 Å
c	15.887 ± 0.006 Å
α	90°
β	90°
γ	120°
Cell volume	235.18 ± 0.12 Å³
Cell temperature	293 ± 2 K
Ambient diffraction temperature	293 ± 2 K
Number of distinct elements	4
Space group number	194
Hermann-Mauguin space group symbol	P 63/m m c
Hall space group symbol	-P 6c 2c
Residual factor for all reflections	0.032
Residual factor for significantly intense reflections	0.032
Weighted residual factors for significantly intense reflections	0.0826
Weighted residual factors for all reflections included in the refinement	0.0826
Goodness-of-fit parameter for all reflections included in the refinement	1.221
Diffraction radiation wavelength	0.71073 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	No

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