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Information card for entry 2100334
Preview
| Coordinates | 2100334.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | Al0.84 Ga1.3 K0.157 O7 Ti1.86 |
|---|---|
| Calculated formula | Al0.836 Ga1.2969 K0.157 O7 Ti1.857 |
| Title of publication | X-ray diffraction study for one-dimensional ionic conductors K~<i>x~</i>(Ga~1{-~<i>y</i>}Al~y~)~2+<i>x~</i>Ti~2{-~<i>x</i>}O~7~ (<i>x</i> ≃0.14, <i>y</i> ≃0.10, 0.23, 0.39) |
| Authors of publication | Michiue, Yuichi; Yoshikado, Shinzo |
| Journal of publication | Acta Crystallographica Section B |
| Year of publication | 2005 |
| Journal volume | 61 |
| Journal issue | 6 |
| Pages of publication | 608 - 615 |
| a | 18.0088 ± 0.0012 Å |
| b | 18.0088 ± 0.0012 Å |
| c | 2.9759 ± 0.0014 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 965.1 ± 0.5 Å3 |
| Cell temperature | 298 K |
| Ambient diffraction temperature | 298 K |
| Number of distinct elements | 5 |
| Space group number | 87 |
| Hermann-Mauguin space group symbol | I 4/m |
| Hall space group symbol | -I 4 |
| Residual factor for all reflections | 0.0857 |
| Residual factor for significantly intense reflections | 0.0434 |
| Weighted residual factors for significantly intense reflections | 0.0665 |
| Weighted residual factors for all reflections included in the refinement | 0.0715 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.99 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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