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Information card for entry 2022742
Preview
| Coordinates | 2022742.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | Tetrakis(4,5-dihydrofuran-2-yl)silane |
|---|---|
| Formula | C16 H20 O4 Si |
| Calculated formula | C16 H20 O4 Si |
| Title of publication | Crystal structures and Hirshfeld surface analyses of tetra-kis-(4,5-di-hydro-furan-2-yl)silane and tetra-kis-(4,5-di-hydro-furan-2-yl)germane. |
| Authors of publication | Ressel, Arnold; Krupp, Anna; Strohmann, Carsten |
| Journal of publication | Acta crystallographica. Section E, Crystallographic communications |
| Year of publication | 2023 |
| Journal volume | 79 |
| Journal issue | Pt 5 |
| Pages of publication | 458 - 464 |
| a | 14.2044 ± 0.0007 Å |
| b | 14.2458 ± 0.0007 Å |
| c | 15.4851 ± 0.0008 Å |
| α | 90° |
| β | 102.605 ± 0.002° |
| γ | 90° |
| Cell volume | 3057.9 ± 0.3 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0385 |
| Residual factor for significantly intense reflections | 0.0367 |
| Weighted residual factors for significantly intense reflections | 0.1011 |
| Weighted residual factors for all reflections included in the refinement | 0.103 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.026 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 284380 (current) | 2023-06-06 | cif/ Updating files of 2022742 Original log message: Adding full bibliography for 2022742.cif. |
2022742.cif |
| 282650 | 2023-04-15 | cif/ hkl/ Adding structures of 2022742 via cif-deposit CGI script. |
2022742.cif |
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Users of the data should acknowledge the original authors of the
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