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Information card for entry 2003191
Preview
| Coordinates | 2003191.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | (η^5^-Cyclopentadienyl)[η^2^-diphenyl(o-phenylene)methyl] oxo(trimethylsilylmethylthio)tungsten(VI) |
|---|---|
| Formula | C29 H32 O S Si W |
| Calculated formula | C29 H32 O S Si W |
| Title of publication | (η5-Cyclopentadienyl)[2-(1,1-diphenylethyl-C^2^)phenyl-C^1^]oxo (trimethylsilylmethylthio)tungsten, [WO(C~4~H~11~SSi)(C~5~H~5~)(C~20~H~16~)] |
| Authors of publication | Brunet, Nathalie; Legzdins, Peter; Trotter, James; Yee, Vivien C. |
| Journal of publication | Acta Crystallographica, Section C: Crystal Structure Communications |
| Year of publication | 1995 |
| Journal volume | 51 |
| Journal issue | 2 |
| Pages of publication | 193 - 195 |
| a | 9.415 ± 0.002 Å |
| b | 11.539 ± 0.003 Å |
| c | 13.388 ± 0.002 Å |
| α | 72.18 ± 0.01° |
| β | 79.37 ± 0.01° |
| γ | 76.9 ± 0.03° |
| Cell volume | 1338.2 ± 0.5 Å3 |
| Cell temperature | 294 K |
| Ambient diffraction temperature | 294 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.04 |
| Residual factor for significantly intense reflections | 0.027 |
| Weighted residual factors for all reflections | 0.032 |
| Weighted residual factors for significantly intense reflections | 0.032 |
| Goodness-of-fit parameter for significantly intense reflections | 1.25 |
| Diffraction radiation wavelength | 0.7093 Å |
| Diffraction radiation type | MolybdenumKα~1~ |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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